| 标题 |
Nanosheet Width Investigation for Gate-All-Around Devices Targeting SRAM Application |
| 网址 | |
| DOI | |
| 其它 |
期刊:2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) 作者:Ashish Pal; El Mehdi Bazizi; Benjamin Colombeau; Blessy Alexander; Buvna Ayyagari-Sangamalli 出版日期:2021-09-27 |
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(2025-6-4)