| 标题 |
Experimental Validation of Switching Dependence of Nanoscale Y2O3 Memristors on Electrode Symmetry via Physical Electrothermal Modeling |
| 网址 | |
| DOI | |
| 其它 |
期刊:ACS Applied Electronic Materials 作者:M. Gautam; Sanjay Kumar; S. Chaudhary; Lokesh Kumar Hindoliya; Dhananjay D. Kumbhar; et al 出版日期:2023-07-05 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人下载。 |
PDF的下载单位、IP信息已删除
(2025-6-4)