| 标题 |
Enhanced Process Control for Dry Etching of Functional TiN Structures on 300 mm Wafer Level |
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| DOI | |
| 其它 |
期刊:2024 IEEE 10th Electronics System-Integration Technology Conference (ESTC) 作者:Johann Fell; Steffen Bickel; Conny Fiedler; Annekatrin Delan; Manuela Junghähnel 出版日期:2024-09-11 |
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(2025-6-4)