| 标题 |
Investigation on Distinct Two-Stage R on Degradation Mechanisms in STI-and LOCOS-Based Triple RESURF LDMOS Devices |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Electron Devices 作者:Wenbo Liu; Penglong Xu; Chunxia Ma; Feng Lin; Bo Zhang; et al 出版日期:2025-01-01 |
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(2025-6-4)