| 标题 |
High Linearity and Low Noise Au-Free Ohmic Contact AlGaN/GaN HEMT Using Patterned Ohmic Recess for Ka-Band Applications |
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| 其它 |
期刊:2025 16th German Microwave Conference (GeMiC) 作者:Howie Tseng; Ying-Ciao Chen; Yueh-Chin Lin; Edward Yi Chang 出版日期:2025 |
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(2025-6-4)