| 标题 |
Experimental Demonstration of Conjugate Structured Illumination Microscopy (c-SIM) for Sensing Deep Subwavelength Perturbations in Background Nanopatterns |
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| DOI | |
| 其它 |
期刊:ACS Photonics 作者:Jinsong Zhang; Renjie Zhou; Nicholas X. Fang; Weijie Deng; Jinlong Zhu; et al 出版日期:2025-04-24 |
| 求助人 | |
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(2025-6-4)