| 标题 |
The role of anchor imposed motion in the failure of MEMS microphones under free fall tests |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microelectronics Reliability 作者:Aldo Ghisi; David Faraci; Silvia Adorno; Alberto Corigliano 出版日期:2022-06-17 |
| 求助人 | |
| 下载 |
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(2025-6-4)