| 标题 |
Two-step resist-development process of hydrogen silsesquioxane for high-density electron-beam nanopatterning |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 作者:Hyo-Sung Lee; Jung-Sub Wi; Sung-Wook Nam; Hyun-Mi Kim; Ki-Bum Kim 出版日期:2009 |
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(2025-6-4)