| 标题 |
Off-axis bright- and dark-field OCT for non-destructive subsurface defect detection in silicon carbide |
| 网址 | |
| DOI |
10.37188/lam.2026.060
doi
|
| 其它 |
期刊:Light: Advanced Manufacturing 作者:Dacheng Wang; Chengchen Zhou; Yukun Wang; Lingzhong Li; Yue Ding; et al 出版日期:2026-01-01 |
| 求助人 | |
| 下载 |
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(2025-6-4)