| 标题 |
Electro-Thermal Reliability Assessment of an Asymmetric Spacer Complementary FET: Device to Circuit Co-Optimization |
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| 其它 |
期刊:IEEE Transactions on Device and Materials Reliability 作者:Sandeep Kumar; Deven H. Patil; Vanshika Ghai; Sunil Rathore; Govind Bajpai; et al 出版日期:2026-09-01 |
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(2025-6-4)