| 标题 |
[高分]
Reducing dynamic-RON and ΔVTH in GaN E-mode HEMTs by integrating p+-GaN/p-InGaN/p-GaN composite gate with gate termination extension: Simulation evidence |
| 网址 | |
| DOI | |
| 其它 |
期刊:Micro and Nanostructures 作者:Liyan Huang; Youyang Wang; Yu Sun; Xiaobo Zhu; Wenhua Gu 出版日期:2026 |
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(2025-6-4)