| 标题 |
Flash electropolishing for TEM: Reducing FIB‐induced defects in tungsten with protocols for new materials # |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Microscopy 作者:Yan‐Ru Lin; Weicheng Zhong; Sabrina E. Calzada; Timothy G. Lach; Lauren J. Nuckols; et al 出版日期:2026-05-23 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人或该文件上传人下载。 |
PDF的下载单位、IP信息已删除
(2025-6-4)