| 标题 |
Degradation Analysis of Thick Film Chip Resistors |
| 网址 | |
| DOI | |
| 其它 |
期刊:ISTFA 2009: Conference Proceedings from the 35th International Symposium for Testing and Failure Analysis 作者:Bhanu Sood; Diganta Das; Michael H. Azarian; Michael Pecht 出版日期:2009 |
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(2025-6-4)