| 标题 |
Synthetic mask layout generation for machine learning-based OPC modeling in NA 0.33 EUV lithography |
| 网址 | |
| DOI |
10.1117/12.3118620
doi
|
| 其它 |
期刊:Photomask Japan 2026: XXXII Symposium on Photomask and Next-Generation Lithography Mask Technology 作者:Renyang Meng; Dongbo Xu; Po-Cheng Chen; Nicolas Besset; Sophie Rissberger; et al 出版日期:2026-09-24 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人或该文件上传人下载。 |
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(2025-6-4)