| 标题 |
High spatial resolution extended x‐ray emission fine structure (EXEFS) spectra of an electronic device measured by electron probe microanalysis (EPMA) |
| 网址 | |
| DOI | |
| 其它 |
期刊:Surface and Interface Analysis 作者:J. Kawai; Hideyuki Takahashi 出版日期:2001-02-01 |
| 求助人 | |
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(2025-6-4)