| 标题 |
A Lock-In thermography based post-processing scheme for the detection of sub-surface rivet-related defects in aircraft structures |
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| DOI | |
| 其它 |
期刊:Mechanical Systems and Signal Processing 作者:Haris Ali Khan; Shahab Uddin; Sharjeel Salik; Ali Javaid; Talha Ali Khan; et al 出版日期:2025-02-07 |
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(2025-6-4)