| 标题 |
Native defect clustering-induced carrier localization centers leading to a reduction of performance in Ga0.70In0.30N/GaN quantum wells |
| 网址 | |
| DOI |
10.1364/oe.486721
doi
|
| 其它 |
期刊:Optics Express 作者:Dong‐Pyo Han; Jiwon Kim; Dong‐Soo Shin; Jong‐In Shim 出版日期:2023-04-20 |
| 求助人 | |
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(2025-6-4)