| 标题 |
Defect inspection of optical components based on dark-field polarization imaging and convolutional neural network recognition algorithms |
| 网址 | |
| DOI |
10.1117/1.oe.62.4.043101
doi
|
| 其它 |
期刊:Optical Engineering 作者:Canhua Xu; Daifu Zheng; Yantang Huang; Zhiping Zeng 出版日期:2023-04-21 |
| 求助人 | |
| 下载 |
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(2025-6-4)