| 标题 |
Long-term high-temperature aging mechanism of copper-metallized through-glass vias: a combined nanoindentation test and hybrid Potts-phase field simulation study |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microsystems & Nanoengineering 作者:Junwei Chen; Zezhan Li; Bin Yang; Xiao Hu; Wenyu Li; et al 出版日期:2026-02-02 |
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(2025-6-4)