| 标题 |
Positive-tone photoresists based on tin-oxo nanoclusters for electron-beam and extreme UV lithography |
| 网址 | |
| DOI | |
| 其它 |
期刊:Advances in Patterning Materials and Processes XLIII 作者:Gayoung Kim; Yejin Ku; Subin Jeon; Jin-Kyun Lee; Sung-Il Lee; et al 出版日期:2026 |
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(2025-6-4)