| 标题 |
Interrelation between ferroelectric properties and defects based on low-frequency noise analysis of HZO ferroelectric capacitor |
| 网址 | |
| DOI | |
| 其它 |
期刊:Applied Physics Letters 作者:Seunghee Jin; Juye Jeon; Min Jung Kim; Kiseok Heo; Jeong Hun Kim; et al 出版日期:2023-04-28 |
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(2025-6-4)