| 标题 |
Geometric-contrast-driven threading dislocations identification in 4H-SiC via synergistic micro-etching and X-ray topography |
| 网址 | |
| DOI | |
| 其它 |
期刊:Materials Science and Engineering: B 作者:Kerui Chen; Jiangfeng Wang; Shan Yang; Guangzhao Li; Li Sun; et al 出版日期:2026 |
| 求助人 | |
| 下载 |
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(2025-6-4)