| 标题 |
Atomic Layer Deposition of Disordered p‐Type SnO Using a Heteroleptic Tin(II) Precursor: Influence of Disorder on P‐Channel SnO Thin‐Film Transistor Characteristics |
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| DOI | |
| 其它 |
期刊:Advanced Electronic Materials 作者:Benjamin J. Peek; Kham Man Niang; Benjamin McMitchell; Heath Bagshaw; Karl Dawson; et al 出版日期:2026-04-20 |
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(2025-6-4)