| 标题 |
Unintended Carbon-Related Impurity and Negative Bias Instability in High-Mobility Oxide TFTs |
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| DOI | |
| 其它 |
期刊:IEEE Electron Device Letters 作者:Yu‐Shien Shiah; Kihyung Sim; Shigenori Ueda; Junghwan Kim; Hideo Hosono 出版日期:2021-07-30 |
| 求助人 | |
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(2025-6-4)