| 标题 |
Impact of Stress and Dimension on Nanosheet Deformation during Channel Release of Gate-All-Around Device |
| 网址 | |
| DOI | |
| 其它 |
期刊:Micromachines (Basel) 作者:Yang J, Chen K, Wang D, Liu T, Sun X, Wang Q, Huang Z, Pan Z, Xu S, Wang C, Wu C, Xu M, Zhang DW 出版日期:2023-03-07 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人下载。 |
PDF的下载单位、IP信息已删除
(2025-6-4)