| 标题 |
Electron-Beam scanning Micro-CT with phase interference-driven resolution enhancement—enhancing clarity of internal microstructures in materials |
| 网址 | |
| DOI | |
| 其它 |
期刊:Optics & Laser Technology 作者:Guowei Zhong; Haijun Yu; Yufang Cai; Fengxiao Li; Chengfeng Liu; Rifeng Zhou 出版日期:2026 |
| 求助人 | |
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(2025-6-4)