| 标题 |
High‐Reliability Sol‐Gel‐Derived Barium Zirconate ECM Memristor With Large Memory Window and Ultrafast Write/Erase Speeds |
| 网址 | |
| DOI | |
| 其它 |
期刊:Advanced Materials Technologies 作者:Bo‐Ruei Huang; Yun‐Qiao Rao; Wen‐Chiang Chang; Bo‐An Ko; Li‐En Liu; et al 出版日期:2026-02-19 |
| 求助人 | |
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(2025-6-4)