| 标题 |
Reliability Study of 1T1C FeRAM Arrays With Hf0.5Zr0.5O₂ Thickness Scaling |
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| DOI | |
| 其它 |
期刊:IEEE Journal of the Electron Devices Society 作者:Jun Okuno; Takafumi Kunihiro; Kenta KONISHI; Yusuke Shuto; Fumitaka Sugaya; et al 出版日期:2022-01-01 |
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(2025-6-4)