| 标题 |
High Resolution TEM and Electron Diffraction Study of Graphene Layers |
| 网址 | |
| DOI |
10.1017/s1431927609098808
doi
|
| 其它 |
期刊:Microscopy and Microanalysis 作者:Y Suh; S Park; M Kim 出版日期:2009-07-27 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人下载。 |
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(2025-6-4)