| 标题 |
Experimental Characterization of Dynamic COSS Losses in 600 V GaN HEMTs based on a Novel and Simple Calorimetric Method |
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期刊:2024 IEEE Applied Power Electronics Conference and Exposition (APEC) 作者:Stefano De Filippis; Matthias J. Kasper; Alex Pacini; José Miguel Sanz-Alcaine; Gerald Deboy 出版日期:2024-05-03 |
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(2025-6-4)