| 标题 |
Experimental Validation of Buffer Traps-Driven Electric Field Dynamics Governing Breakdown and Leakage Trends in AlGaN/GaN Heterostructures |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE International Reliability Physics Symposium 作者:R. Malik; Simran R. Karthik; V. Joshi; R. Chaudhuri; Mohammad Ateeb Munshi; et al 出版日期:2025-03-30 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人或该文件上传人下载。 |
PDF的下载单位、IP信息已删除
(2025-6-4)