| 标题 |
Intrafraction verification of gated RapidArc by using beam-level kilovoltage X-ray images |
| 网址 | |
| DOI | |
| 其它 |
期刊:International journal of radiation oncology, biology, physics 作者:Li R; Mok E; Chang DT; Daly M; Loo BW Jr; et al 出版日期:2012/08/01 |
| 求助人 | |
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(2025-6-4)