| 标题 |
High energy X-ray diffraction analysis of strain and residual stress in silicon nitride ceramic diffusion bonds |
| 网址 | |
| DOI | |
| 其它 |
期刊:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 作者:M. Vila; C. Prieto; P. Miranzo; M.I. Osendi; A.E. Terry; et al 出版日期:2005-08-10 |
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(2025-6-4)