| 标题 |
Effect of yttrium feeding time on the electrical and structural properties of atomic layer deposited Y-doped TiO2 films for dynamic random-access memory capacitors |
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| DOI | |
| 其它 |
期刊:Journal of Materials Chemistry C 作者:Tae Kyun Kim; Haengha Seo; Junil Lim; Heewon Paik; Jonghoon Shin; et al 出版日期:2025 |
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(2025-6-4)