| 标题 |
Transmission Electron Microscopy of Spontaneous Tin (Sn) Whisker Growth under High Temperature/Humidity Storage |
| 网址 | |
| DOI | |
| 其它 |
期刊:2008 10th Electronics Packaging Technology Conference 作者:H. Sosiati; N. Hirokado; N. Kuwano; Y. Ohno 出版日期:2009-01-30 |
| 求助人 | |
| 下载 |
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(2025-6-4)