| 标题 |
A fast-switching threshold memristor based on AlN/Ag/AlN stacked device for mental disorder electroencephalogram recognition |
| 网址 | |
| DOI | |
| 其它 |
期刊:Applied Physics Letters 作者:Kangbo Zhao; Zhe Fan; Kaoshan Zhang; Shuai Yan; Xin Hu; Xiaobing Yan 出版日期:2026 |
| 求助人 | |
| 下载 |
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(2025-6-4)