| 标题 |
Shape and Roughness Extraction of Line Gratings by Small Angle X-Ray Scattering: Statistics and Simulations |
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| DOI | |
| 其它 |
期刊:IEEE Transactions on Semiconductor Manufacturing 作者:Jerome Reche; Patrice Gergaud; Yoann Blancquaert; Maxime Besacier; Guillaume Freychet 出版日期:2022 |
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(2025-6-4)