| 标题 |
On the Correlation Between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level – Part I |
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| DOI | |
| 其它 |
期刊:IEEE Transactions on Electromagnetic Compatibility 作者:Alexandre Boyer; Nicolas Nolhier; Fabrice Caignet; Sonia Ben Dhia 出版日期:2022-05-10 |
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(2025-6-4)