| 标题 |
Multiphysics Simulation of Hybrid Bonding Process-Induced Stress Effects on Quantum Transport in p-Type FinFET in Integrated Chiplets |
| 网址 | |
| DOI | |
| 其它 |
期刊:International Symposium on Radio-Frequency Integration Technology 作者:Liang Tian; Wenchao Chen; Yizhang Liu; Shuo Zhang; Erping Li 出版日期:2024-08-28 |
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(2025-6-4)