| 标题 |
A KPI-related fault diagnosis method for multimode manufacturing processes based on supervised minimal gated unit and sparse broad learning system |
| 网址 | |
| DOI | |
| 其它 |
期刊:Applied Soft Computing 作者:Chuanfang Zhang; Wenxiao Yin; Chi Zhang; Kaixiang Peng; Xueyi Zhang 出版日期:2025-08-23 |
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(2025-6-4)