| 标题 |
Optimization method of optical proximity correction for mitigation of H-V CD bias and local CD variation in DRAM hexagonal array features induced by mask 3D and curved slit at EUV lithography |
| 网址 | |
| DOI |
10.1117/12.3117453
doi
|
| 其它 |
期刊:International Conference on Extreme Ultraviolet Lithography 2026 作者:Harim Oh; Ahram Suh; Yongwoo Kim; Chan Hwang; Yongchan Kim 出版日期:2026-10-23 |
| 求助人 | |
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(2025-6-4)