| 标题 |
Differences between GaAs/GaInP and GaAs/AlInP interfaces grown by movpe revealed by depth profiling and angle-resolved X-ray photoelectron spectroscopies |
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期刊:Applied Surface Science 作者:M.C. López-Escalante; M. Gabás; I. García; E. Barrigón; I. Rey-Stolle; et al 出版日期:2015-11-10 |
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(2025-6-4)