| 标题 |
Evaluation of Leakage Currents of Semiconductor Packages Due to High-Voltage Stress Under an Immersion Cooling Environment |
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| DOI | |
| 其它 |
期刊:Applied Sciences 作者:Kyuhae Min; Taejun Kang; Tae Yeob Kang; Jae-Bum Pyo 出版日期:2025-04-23 |
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(2025-6-4)