| 标题 |
Selectivity and stability reshaping high-sensitivity detection boundaries: A technical leap and paradigm shift in semiconductor surface-enhanced Raman scattering |
| 网址 | |
| DOI |
10.26599/nr.2026.94908347
doi
|
| 其它 |
期刊:Nano Research 作者:Jie Lin; Xiangyu Meng; Yujiao Xie; Yusi Peng; Xingce Fan; et al 出版日期:2025-12-18 |
| 求助人 | |
| 下载 |
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(2025-6-4)