| 标题 |
[高分]
Influence of etch profiles on the leakage current and capacitance of 3D DRAM strorage capacitors 刻蚀轮廓对三维DRAM存储电容器漏电流和电容的影响
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| 网址 | |
| DOI |
10.5573/JSTS.2019.19.2.208
doi
|
| 其它 | Shin Seongun; Yoon Gyuhan; Choi Woo Young; |
| 求助人 | |
| 下载 |
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(2025-6-4)