| 标题 |
Impact of V-defects on current flow and recombination pathways in long-wavelength GaN-based light-emitting diodes |
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| DOI | |
| 其它 |
期刊:Applied Physics Letters 作者:Tsung-Yin Tsai; T. Tak; Yuh-Renn Wu; J. Speck 出版日期:2026-07-13 |
| 求助人 | |
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(2025-6-4)