| 标题 |
Investigation of Lithium Insertion Mechanisms of a Thin-Film Si Electrode by Coupling Time-of-Flight Secondary-Ion Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Focused-Ion-Beam/SEM |
| 网址 | |
| DOI | |
| 其它 |
期刊:ACS Applied Materials & Interfaces 作者:Arnaud Bordes; Eric De Vito; Cédric Haon; Christophe Secouard; Alexandre Montani; Philippe Marcus 出版日期:2015-12-01 |
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(2025-6-4)