| 标题 |
Avalanche Capability Improvement by Optimizing p+ Contact Resistance for N-Channel Trench Power MOSFETs |
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| DOI | |
| 其它 |
期刊:IEEE Transactions on Semiconductor Manufacturing 作者:Keisuke Miyamoto; Daichi Ishi; Hiroyuki Kishimoto; Kazuyuki Sato; Tsuyoshi Kachi; Hiroaki Kato 出版日期:2025 |
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(2025-6-4)