| 标题 |
In-situ measurement of thermal expansion in Cu/SiO2 hybrid structures using atomic force microscopy at elevated temperatures |
| 网址 | |
| DOI | |
| 其它 |
期刊:Applications of Surface Science 作者:Huai-En Lin; Dinh-Phuc Tran; Wei-Lan Chiu; Hsiang-Hung Chang; Chih-Huang Chen 出版日期:2024-07-01 |
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(2025-6-4)