| 标题 |
Evaluating the effects of thin film patterns on the temperature distribution of silican wafers during radiant processing |
| 网址 | |
| DOI |
10.1117/1.1305525
doi
|
| 其它 |
期刊:Optical Engineering 作者:Haruna Tada; Alexis Abramson; Seth E. Mann; Ioannis N. Miaoulis; Peter Y. Wong 出版日期:2002-07-26 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人或该文件上传人下载。 |
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(2025-6-4)